Re: A possible topic for discussion and learning for scope users Archived Message
Posted by Trevor Grigg on February 2, 2004, 6:40 pm, in reply to "Re: A possible topic for discussion and learning for scope users"
As with a lot of our work we techs undertake, there is never an exacting science with testing,however i would have to agree with J.S.that we can sometimes over aynalise and read to much into data,from my experiances of scope testing and using glitch capture you could soon, as James suggests start to condemn a large number of components and circuits.The items J.S.details would be on my list as the biggest culprits for corrupting ecus,most ecus have filters/current limiting stages etc,perhaps this subject could expand in to to much of a diverse subject!!. On another note the seems to be a lot more emphasis on testing circuits using a Milli amp probe on ign/injector circuits etc,would welcome any comments if this method enhances evaluation in our field?.I have looked up the cost of some of these probes in the RS cat, and some are a whopping £300-£400,any comments would be welcome on the current testing area,and an alternative supply for a probe inductive clamp,regards Trevor.
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